Search results for "Electron yield"
showing 6 items of 6 documents
Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models
2018
[EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.
Element-Specific Magnetic and Electronic Properties of Epitaxial Heusler Films
2015
X-ray magnetic circular dichroism (XMCD) provides an experimental access to element-specific electronic properties of thin epitaxial films of Heusler alloys. The combination of bulk-sensitive transmission and surface-sensitive electron yield methods reveals quantitative information on bulk and interface properties. Extreme cases of magnetically dead and life layers at interfaces illustrate the high potential of XMCD. The dependence of XMCD on disorder, structure and composition is discussed as well as dynamic properties investigated by a combination of ferromagnetic resonance and XMCD. Examples are shown where spectroscopic information provided by XMCD is exploited to discuss subtle changes…
Experimental Study of the Multipactor Effect in a Partially Dielectric-Loaded Rectangular Waveguide
2019
This letter presents the experimental study of the multipactor threshold in a partially dielectric-loaded rectangular waveguide, whose results validate a multipactor model recently developed by the authors, which includes the charge distribution appearing on the dielectric surface during the multipactor discharge. First, the variation of the multipactor RF voltage threshold has been theoretically analyzed in different waveguide configurations: in an empty waveguide, and also in the cases of a one-sided and two-sided dielectric-loaded waveguides. To reach this aim, an in-house Monte Carlo simulation tool has been developed. The Secondary Electron Yield (SEY) of the metallic and dielectric ma…
"Table 5" of "Measurement of dielectron production in central Pb-Pb collisions at $\sqrt{{\textit{s}}_{\mathrm{NN}}}$ = 2.76 TeV"
2018
Dielectron invariant-mass spectrum measured in central Pb-Pb collisions for the transverse-momentum interval 1.0 < $p_{\rm T,ee}$ < 2.0 GeV/$c. The statistical and systematic uncertainties of the data are represented by vertical bars and boxes.
"Table 1" of "Measurement of dielectron production in central Pb-Pb collisions at $\sqrt{{\textit{s}}_{\mathrm{NN}}}$ = 2.76 TeV"
2018
Dielectron invariant-mass spectrum measured in central Pb-Pb collisions at $\sqrt{s_{NN}}$ = 2.76 TeV. The statistical and systematic uncertainties of the data are represented by vertical bars and boxes.
"Table 6" of "Measurement of dielectron production in central Pb-Pb collisions at $\sqrt{{\textit{s}}_{\mathrm{NN}}}$ = 2.76 TeV"
2018
Dielectron invariant-mass spectrum measured in central Pb--Pb collisions for the transverse-momentum interval 2.0 < $p_{\rm T,ee}$ < 4.0 GeV/$c. The statistical and systematic uncertainties of the data are represented by vertical bars and boxes.